A Challenge for 3μm SPAD Pixel Using Embedded Metal Contact on Deep Trench Pixel Isolation
Abstract
We demonstrate photon-counting operation with a 3.06-μm-pitch SPAD pixel by using the embedded metal contact in the pixel. The peak PDE through the green color filter is 57 % and the DCR is 15.8 cps with 20.9 V of Vbd and 3 V of Vex. In addition, cross talk probability is less than 0.4 % because of full trench isolation with metal light shielding. The PDE obtained is significantly higher than those in previous works with equal or smaller than 5-μm-pitch pixels, and the DCR is comparable to those in previous works with 6-μm-pitch pixels.
- 著者
- 所属
- Sony Semiconductor Solutions Corporation
- 学会・学術誌
- ISSW
- 年
- 2022
