In situ Atomic-Scale STEM Imaging of Electron-Beam Induced Dynamics at PbS–Pb Solid–Liquid Nanointerfaces
Abstract
Understanding structures and dynamics of solid–liquid interfaces at the atomic scale is indispensable for controlling various phenomena occurring at the interfaces. Although transmission electron microscopy (TEM) is one of the powerful techniques to unravel the nature of solid–liquid interfaces, the effects of electron-beam irradiation must also be considered. However, little is known about the atomic-scale interaction between incident electrons and solid–liquid interfaces because it is challenging to prepare nano-sized interfaces suitable for detailed investigations. Here, we fabricated PbS–Pb solid–liquid nanointerfaces less than 10 nm in diameter and investigated electron-beam induced dynamics at solid–liquid interfaces at the atomic scale.
- 所属
- Sony Semiconductor Solutions Corporation
- 学会・学術誌
- M & M
- 年
- 2023
